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Journal Articles Solid-State Electronics Year : 2020

Analytic modeling of breakdown voltage shift in the CMOS buried multiple junction detector

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Electronics
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hal-02463250 , version 1 (21-12-2021)

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Attribution - NonCommercial

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Thais Luana Vidal de Negreiros da Silva, Pascal Kleimann, Patrick Pittet, Guo-Neng Lu. Analytic modeling of breakdown voltage shift in the CMOS buried multiple junction detector. Solid-State Electronics, 2020, 164, pp.107682. ⟨10.1016/j.sse.2019.107682⟩. ⟨hal-02463250⟩
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