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Bienvenue sur la collection HAL du LARIS
Direction | Sébastien LAHAYE
Référent·e HAL | Marie-Françoise GÉRARD
Fichiers
470
Références
823
Proportion d'Open Access
45 %
Actualités du Laboratoire
Arthur IGNAZI nous présentera ses travaux de thèse intitulés "Les box atlas : une décomposition des manifolds pour l'analyse par intervalles" le 16 mai 2024 à 11h00.
Mots-Clés
Cognition
Lean manufacturing
Feature extraction
Parameter estimation
Quantum noise
Degradation
Scheduling
Empirical mode decomposition
Interaction Techniques
Correlation
Segmentation
Concrete
Max
Accelerated degradation test
Texture
Degradation process
Estimation
Reliability
Nonlinear dynamics
Machine learning
Diagnostic
Decoherence
Control chart
Partial differential equations
Laser speckle contrast imaging
Numerical simulation
Conjugate gradient method
Fault detection
Heat recovery
Inverse problem
Simulation
Microcirculation
Electroencephalography
Graph matching
Entropy
Identification
COVID-19
Diagnosis
Prediction
State estimation
Modeling
Quantum information
Multiscale entropy
Data mining
MRI
Conducted immunity
Inverse problems
Quadratic assignment problem
Thermal comfort
MATLAB
Irregularity
Fault diagnosis
Bayesian inference
Stroke
Convolutional neural network
Complexity
Bayesian networks
Heat transfer
Timed event graphs
Max-plus algebra
Algorithm
Durability
Virtual reality
Control
Gamma process
Data augmentation
Deep learning
Discrete event systems
Complex systems
Petri nets
Optimisation
Classification
Bayesian network
Accelerated tests
Computer vision
Accelerated testing
Detection
Image analysis
Sample entropy
Image processing
Stochastic resonance
Monitoring
Six Sigma
Awake surgery
Machine Learning
Interval analysis
Brain
Epilepsy
Social cognition
Cycle time
Aging
Imaging
Optimization
Complexité
Cerebral palsy
Thermal modeling
Fiabilité
Performance
Réalité virtuelle
Older adults
Publications des équipes de recherche du LARIS
SDO | Systèmes Dynamiques et Optimisation ISISV | Information, Signal, Image et Sciences du Vivant SFD | Sûreté de Fonctionnement et aide à la DécisionDernières parutions
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Jaber Al Rashid, Mohsen Koohestani, Laurent Saintis, Mihaela Barreau. Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and A Case Study. IEEE Transactions on Device and Materials Reliability, 2024, 24 (1), pp.2-13. ⟨10.1109/TDMR.2023.3340426⟩. ⟨hal-04334074⟩