The influence of deposition parameters on the structural quality of PLD-grown GaN/sapphire thin films - Archive ouverte HAL Access content directly
Journal Articles Applied Surface Science Year : 2014

The influence of deposition parameters on the structural quality of PLD-grown GaN/sapphire thin films

M. Kawwam
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hal-02310844 , version 1 (10-10-2019)

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M. Kawwam, Kheirreddine Lebbou. The influence of deposition parameters on the structural quality of PLD-grown GaN/sapphire thin films. Applied Surface Science, 2014, 292, pp.906-914. ⟨10.1016/j.apsusc.2013.12.078⟩. ⟨hal-02310844⟩
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