Low-absorption, multi-layered scintillating material for high resolution real-time X-ray beam analysis - Université Claude Bernard Lyon 1 Accéder directement au contenu
Article Dans Une Revue Journal of Materials Chemistry C Année : 2015

Low-absorption, multi-layered scintillating material for high resolution real-time X-ray beam analysis

Résumé

For online X-ray beam analysis, we introduce a functional device, a multilayer scintillating screen, that succeeds in satisfying three important criteria: high X-ray transparency and high overall efficiency, which are not easily reconcilable using existing devices, as well as high spatial resolution capability. It combines a porous alumina substrate, an optical gold interposer of few nm and an efficient scintillating material (Lu2O3:Eu3+) 450 nm thick. Both layers are deposited using pulsed laser deposition. This multilayer device enables high resolution X-ray imaging while X-ray transparency is preserved to 90% even at 15 keV. Such a device is suitable for real-time X-ray beam analysis at high frequency and is a breakthrough for real-time X-ray beam corrections for most of the synchrotron experiments.
Fichier non déposé

Dates et versions

hal-02305580 , version 1 (04-10-2019)

Identifiants

Citer

Antonio Pereira, Thierry Martin, Mariana Levinta, Christophe Dujardin. Low-absorption, multi-layered scintillating material for high resolution real-time X-ray beam analysis. Journal of Materials Chemistry C, 2015, 3, pp.4954-4959. ⟨10.1039/c5tc00121h⟩. ⟨hal-02305580⟩
26 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More