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Noise Modeling For Charge Amplification and Sampling

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hal-02000845 , version 1 (30-01-2019)

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  • HAL Id : hal-02000845 , version 1

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Patrick Pittet, Guo-Neng Lu, Laurent Quiquerez. Noise Modeling For Charge Amplification and Sampling. 2006 13th IEEE International Conference on Electronics, Circuits and Systems, Dec 2006, Nice, France. pp.9-12. ⟨hal-02000845⟩
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