Effects of the thickness on the properties of erbium-doped silicon-rich silicon oxide thin films - Equipe NIMPH du CIMAP - Nanomatériaux, Ions et Métamatériaux pour la PHotonique Accéder directement au contenu
Article Dans Une Revue physica status solidi (c) Année : 2011

Effects of the thickness on the properties of erbium-doped silicon-rich silicon oxide thin films

Résumé

The present study examines the influence of the layer thickness on the emission of Er ions coupled to Si nanoclusters within a silica matrix obtained by magnetron co-sputtering at two typical temperatures (ambient and 500 °C. Such an investigation is essential to optimise the material for specific applications, inasmuch as thin layers of tens of nm are requested for electrically-excited devices, while much thicker films (≥ 1 µm) are necessary for optically-excited waveguides, lasers, etc. The Er PL was detected from as-deposited samples with significant intensity for that grown at 500 °C. This PL improves with annealing and also with the layer thickness, up to a factor 4 when the thickness is increased from few tens to more than 1.3 µm. The origin of this behaviour seems to lie in some limiting factors related to the film thinness, such as barriers for nucleation and growth of sensitizers (Si-ncs), stresses affecting the onset of phase separation and then the formation of Si-ncs. To favour the growth of Si-ncs in films as thin as tens of nm, the increase of the amount of Si excess was found to be necessary to enhance the Er PL through an increase of the density of Si-ncs and, therefore, the coupling with Er ions. Such an enrichment with Si offers an additional advantage of favouring the injection and transport of carriers by electrical excitation
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Dates et versions

hal-01139274 , version 1 (28-04-2017)

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Sébastien Cueff, Christophe Labbé, Julien Cardin, Khalil Hijazi, Jean-Louis Doualan, et al.. Effects of the thickness on the properties of erbium-doped silicon-rich silicon oxide thin films. physica status solidi (c), 2011, E-MRS 2010 Spring Meeting – Symposium I: Advanced Silicon Materials Research for Electronic and Photovoltaic Applications II • E-MRS 2010 Spring Meeting – Symposium J: Silicon-based Nanophotonics, 8 (3), pp.1027-1032. ⟨10.1002/pssc.201000390⟩. ⟨hal-01139274⟩
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